Home>Research>Publication

 

Publication

 
 

 

   

International Journal (SCI)

  1. Sanghyun You, Inkyoung Cho, Yu Gwang Jeong, Chang-Koo Kim, "Environmentally Sustainable C3F6 as High-Performance Alternative to CF4 for Plasma Etching of SiO2", ECS Journal of Solid State Science and Technology, 14, 111005 (2025, November 12).

2. Sanghyun You, Minuk Kim, Inkyoung Cho, Junyoung Kim, Sangheon Lee, Chang-Koo Kim, "Cyclic etching of SiO2 contact holes using heptafluoropropyl methyl ether having low global-warming potential", MATERIALS & DESIGN, 114797 (2025, September 24).

3. Seokjin Ko, Dongryul Lee, Jeongmin Kim, Chang-Koo Kim, Jihyun Kim,"Self-Aligned Edge Contact Process for Fabricating High-Performance Transition-Metal Dichalcogenide Field-Effect Transistors", ACS Nano, pp.25009- pp.25017 (2024, August 22).

4. Sang-Hyun You, Eun Jae Sun, Heeyeop Chae, Chang-Koo Kim, "Effect of Discharge Gas Composition on SiC Etching in an HFE-347mmy/O2/Ar Plasma", Materials, 17, pp.3917 (2024, August 7).

5. Sanghyun You, Eun Jae Sun, Yujeong Hwang, and Chang-Koo Kim, ¡°Heptafluoroisopropyl Methyl Ether as a Low Global Warming Potential Alternative for Plasma Etching of SiC¡±, Korean Journal of Chemical Engineering, 41, pp. 1307-1310 (2024 February 5).

6. Sanghyun You, Hyun Seok Yang, Dongjun Jeon, Heeyeop Chae, and Chang-Koo Kim, ¡°Controlling Bowing and Narrowing in SiO2 Contact-Hole Etch Profiles Using Heptafluoropropyl Methyl Ether as an Etchant with Low Global Warming Potential¡±, Coatings, 13(8), pp. 1452-1458 (2023, August 16).

7. Sungun Kang, Chul-Ho Kim, Sanghyun You, Da-Young Lee, Yu-Kwon Kim, Seung-Joo Kim, Chang-Koo Kim and Hee-Kyung Kim, ¡°Plasma Surface Modification of 3Y-TZP at Low and Atmospheric Pressures with Different Treatment Times¡±, International Journal of Molecular Sciences, 24, pp.7663-7679 (2023, February 14).

8. Yongjae Kim, Seoeun Kim, Hojing Kang, Sanghyun You, Chang-Koo Kim, and Heeyeop Chae, ¡°Low Global Warming C4H3F7O Isomers for Plasma Etching of SiO2 and Si3N4 Films¡±, ACS SUSTAINABLE CHEMISTRY & ENGINEERING, 10, pp.10537-10546 (2022, August 1).

9. Yongwoo Jang, Junsoo Bok, Dong Keun Ahn, Chang-Koo Kim, and Ju-Seop Kang, ¡°Human Trial for the Effect of Plasma-Activated Water Spray on Vaginal Cleaning in Patients with Bacterial Vaginosis¡±, Medical Science, 10, pp.331-339 (2022, June 18).

10. Sanghyun You, Yu Jong Lee, Heeyeop Chae, and Chang-Koo Kim, ¡°Plasma Etching of SiO2 Contact Holes Using Hexafluoroisopropanol and C4F8¡±, Coatings, 12, pp.6791-6798 (2022, May 16).

11. Jun-Hyun Kim, Sanghyun You, Chang-Koo Kim, ¡°Plasma etching of SiO2 contact hole using perfluoropropyl vinyl ether and perfluoroisopropyl vinyl ether¡±, Korean Journal of Chemical Engineering, 39, pp.63-68 (2022, January 6).

12. Jun-Hyun Kim, Sanghyun You, Chang-Koo Kim, ¡°Surface Texturing of Si with Periodically Arrayed Oblique Nanopillars to Achieve Antireflection¡±, Materials, 14, pp.3801-3809 (2021, January 14).

13. Jun-Hyun Kim, Jin-Su Park, Chang-Koo Kim, ¡°SiO2 etching in inductively coupled plasmas using heptafluoroisopropyl methyl ether and 1,1,2,2-tetrafluoroethyl 2,2,2-trifluoroethyl ether¡±, Applied Surface Science, 508, pp.144787-1-144787-8 (2020, April 1).

14. Jeong-Guen Bak, Jun-Hyun Kim, Chang-Koo Kim, ¡°Electrical resistivity of Ni–Fe wires coated with Sn using low-pressure chemical vapor deposition¡±, Coatings, 10, pp.317-1 -317-9 (2020, March 27).

15. Jun-Hyun Kim, Chang-Koo Kim, ¡°Si3N4 etch rates at various ion-incidence angles in high-density CF4, CHF3, and C2F6 plasmas¡±, Korean Journal of Chemical Engineering, 37, pp.374-379, (2020, January 30).

16. Jun-Hyun Kim, Jin-Su Park, Yong-Seon Shin, Chang-Koo Kim, ¡°Atmospheric-pressure floating electrode-dielectric barrier discharge with flexible electrodes: Effect of conductor shapes¡±, Korean Journal of Chemical Engineering, 36, pp.1371-1376 (2019, July 31).

17. Jin-Su Park, Suhyun Kim, Jun-Hyun Kim, Chang-Koo Kim, and Jihyun Kim, "Auto-masked texturing of kerf-loss free silicon wafers using hexafluoroisopropanol in a capacitively coupled plasma etching system", ECS Journal of Solid State Science and Technology, 8, pp.Q76-Q79 (2019, May 13).

18. Jun-Hyun Kim, Jin-Su Park, Chang-Koo Kim, ¡°Angular dependence of SiO2 etching in plasmas containing heptafluoropropyl methyl ether¡±, Thin Solid Films, 669, pp.262-268 (2019, January 1).

19. Jun-Hyun Kim, Jin-Su Park, Chang-Koo Kim, ¡°Plasma etching of SiO2 using heptafluoropropyl methyl ether and perfluoropropyl vinyl ether¡±, ECS Journal of Solid State Science and Technology, 7, pp.Q218-Q221 (2018, November 17).

20. Hyemin Lee, Jun-Hyun Kim, Gaoxiang Wu, Hae-Min Lee, Jaekyoung Kim, Dokyeong Kwon, Shu Yang, Chang-Koo Kim, and Hyunsik Yoon, ¡°Clustering and self-recovery of slanted hydrogel micropillars¡±, Advanced Materials Interfaces, 5, pp.1801142 (2018, October 17).

21. Suhyun Kim, Jun-Hyun Kim, Jihyun Kim, and Chang-Koo Kim, ¡°Reducing the optical reflectance of kerf-loss free silicon wafers via auto-masked CF4/O2 plasma etch¡±, ECS Journal of Solid State Science and Technology, 7, pp.Q88-Q91 (2018, May 16).

22. Sooyeoun Oh, Chang-Koo Kim, Jihyun Kim, ¡°High responsivity ¥â-Ga2O3 metal-semiconductor-metal solar-blind photodetectors with ultra-violet transparent graphene electrodes¡±, ACS Photonics, 5, pp.1123-1128 (2018, March 21).

23. Jun-Hyun Kim, Jeong Geun Bak, Kangtaek Lee, Chang-Koo Kim, ¡°Control of the electrical resistivity of Ni-Cr wires using low pressure chemical vapor deposition of tin¡±, Applied Surface Science, 429, pp.134-137 (2018, January 31).

24. Kyongbeom Koh, Yongjae Kim, Chang-Koo Kim, and Heeyeop Chae, ¡°Quasi Atomic Layer Etching of SiO2 using Surface Fluorination for Surface Cleaning¡±, Journal of Vacuum Science and Technology A, 36, pp.01B106-1-5 (2018, January 1).

25. Jun-Hyun Kim, Sung-Woon Cho, and Chang-Koo Kim, ¡°Angular dependence of Si3N4 etching in C4F6/CH2F2/O2/Ar plasmas¡±, Chemical Engineering & Technology, 40, pp.2251-2256 (2017, December 1).

26. Jun-Hyun Kim, Sung-Woon Cho, Chang Jin Park, Heeyeop Chae, Chang-Koo Kim, ¡°Angular dependences of SiO2 etch rates at different bias voltages in CF4, C2F6, and C4F8 plasmas¡±, Thin Solid Films, 637, pp.43-48 (2017, September 1).

27. Hae-Min Lee, Gyoung Hwa Jeong, Sang-Wook Kim, Chang-Koo Kim, ¡°Low-temperature direct synthesis of mesoporous vanadium nitrides for electrochemical capacitors¡±, Applied Surface Science, 400, pp.194-199 (2017, April 1).

28. Haegyu Jang, Hakseung Lee, Honyoung Lee, Chang-Koo Kim, Heeyeop Chae, ¡°Sensitivity enhancement of dielectric plasma etching endpoint detection by optical emission spectra with modified K-means cluster analysis¡±, IEEE Transactions on Semiconductor Manufacturing, 30, pp.17-22 (2017, February 1).

29. Sung-Woon Cho, Jun-Hyun Kim, Hae-Min Lee, Heeyeop Chae, Chang-Koo Kim, ¡°Superhydrophobic Si surfaces having microscale rod structures prepared in a plasma etching system¡±, Surface & Coatings Technology, 306, pp.82-86 (2016, November 25).

30. Sung-Woon Cho, Hae-Min Lee, Jun-Hyun Kim, Jeong Geun Bak, Chang-Koo Kim, ¡°Fabrication of Slanted Cu Nanopillars with Uniform Arrays¡±, Nanomaterials and Nanotechnology, 6, pp.1-5 (2016, March 1).

31. Jun-Hyun Kim, Sung-Woon Cho, Doo Won Kang, Kyung Mi Lee, Chang Yong Baek, Hae-Min Lee, and Chang-Koo Kim, ¡°Electrical, structural, and morphological characteristics of dopantless tin oxide films prepared by low pressure chemical vapor deposition¡±, Science of Advanced Materials, 8, pp.117-121 (2016, January 1).

32. Taegyeong Kang, Kiju Um, Jinmo Park, Hochan Chang, Doh C. Lee, Chang-Koo Kim, Kangtaek Lee ¡°Minimizing the fluorescence quenching caused by uncontrolled aggregation of CdSe/CdS core/shell quantum dots for biosensor applications¡±, Sensors and Actuators B: Chemical, 222, pp.871-878 (2016, January 1).

33. Thanh-Truc Pham, Chinh Nguyen-Huy, Hyun-Jun Lee, Thuy-Duong Nguyen-Phan, Tae Hwan Son, Chang-Koo Kim, and Eun Woo Shin, ¡°Cu-doped TiO2/reduced graphene oxide thin-film photocatalysts: Effect of Cu content upon methylene blue removal in water¡±, Ceramics International, 41 (9), pp.11184-11193 (2015, November 1).

34. Sung-Woon Cho, Jun-Hyun Kim, Jeong Geun Bak, and Chang-Koo Kim, ¡°Fabrication of uniformly arrayed single- and multi-directional slanted Cu nanorods¡±, ECS Solid State Letters, 4 (11), pp.P85-P87 (2015, November 1).

35. Sung-Woon Cho, Jun-Hyun Kim, Sangin Kim, Eun Woo Shin, and Chang-Koo Kim, ¡°Reduction in the diameter of contact holes with a high anisotropy and aspect ratio¡±, ECS Journal of Solid State Science and Technology, 4 (7), pp.P226-P231 (2015, July 1).

36. Thuy-Duong Nguyen-Phan, Chinh Nguyen Huy, Chang-Koo Kim, and Eun Woo Shin, ¡°Facile microwave-assisted synthesis and controllable architecture of three-dimensional nickel titanate¡±, CrystEngComm, 17 (24), pp.4562-4574 (2015, June 28).

37. Hae-Min Lee, Gyoung Hwa Jeong, Doo Won Kang, Sang-Wook Kim, Chang-Koo Kim, ¡°Direct and environmentally benign synthesis of manganese oxide/graphene composites from graphite for electrochemical capacitors¡±, Journal of Power Sources, 281, pp.44-48 (2015, May 1).

38. Hae-Min Lee, Sung-Woon Cho, Chan-Ju Song, Heung Jung Kang, Bum Jin Kwon, Chang-Koo Kim, ¡°Abrupt change with surfactant concentration in the surface morphology of the electrodeposited manganese oxide films for electrochemical capacitors¡±, Electrochimica Acta, 160, pp.50-56 (2015, April 1).

39. Chang Yeong Jeong, Chang-Koo Kim and Sangin Kim, ¡°Slot-embedded photonic-crystal resonator with enhanced modal confinement¡±, Optics Letters, 40, pp.554-557 (2015, Feb. 15).

40. Sung-Woon Cho, Jun-Hyun Kim, Doo Won Kang, Kangtaek Lee, and Chang-Koo Kim, ¡°Single- and multi-directional slanted plasma etching of silicon under practical plasma processing conditions¡±, ECS Journal of Solid State Science and Technology, 3 (11), pp.Q215-Q220 (2014, November 1).

41. Gyoung Hwa Jeong, Hae-Min Lee, Ji-goo Kang, Heewoong Lee, Chang-Koo Kim, Jae-Hyeok Lee, Jae-Ho Kim, and Sang-Wook Kim, ¡°ZrO2-SiO2 nanosheets with ultrasmall WO3 nanoparticles and their enhanced pseudocapacitance and stability¡±, ACS Applied Materials & Interfaces, 6, pp.20171-20178 (2014, October 27).

42. Gyoung Hwa Jeong, Hae-Min Lee, Heewoong Lee, Chang-Koo Kim, Yuanzhe Piao, Jae-Hyeok Lee, Jae-Ho Kim and Sang-Wook Kim, ¡°One-pot synthesis of thin Co(OH)2 nanosheets on graphene and their high activity as a capacitor electrode¡±, RSC Advances, 4, pp.51619-51623 (2014, October 7).

43. Hae-Min Lee, Kangtaek Lee, and Chang-Koo Kim, ¡°Electrodeposition of manganese-nickel oxide films on a graphite sheet for electrochemical capacitor applications¡±, Materials, 7, pp.265-274 (2014, January 9).

44. Haegyu Jang, Jaewook Nam, Chang-Koo Kim, and Heeyeop Chae, ¡°Real-time endpoint detection of small exposed area SiO2 films in plasma etching using plasma impedance monitoring with modified principal component analysis¡±, Plasma Processes and Polymers, 10 (10), pp.850-856 (2013, October 1).

45. S. Rajagopal, D. Nataraj, O. Y. Khyzhun, Yahia Djaoued, Jacques Robichaud, and Chang-Koo Kim, ¡°Controlled synthesis of MoO3 microcrystals by subsequent calcination of hydrothermally grown pyrazine-MoO3 nanorod hybrids and their photodecomposition properties¡±, Materials Chemistry and Physics, 141, pp.383-392 (2013, August 15).

46. Cheolsang Yoon, Hyun-Guk Hong, Hyun Chang Kim, Daehyun Hwang, Doh C. Lee, Chang-Koo Kim, Young-Joo Kim, Kangtaek Lee, ¡°High luminescence efficiency white light emitting diodes based on surface functionalized quantum dots dispersed in polymer matrices¡±, Colloids and Surfaces A: Physicochemical and Engineering Aspects, 428, pp.86-91 (2013, Apr. 02).

47. Sung-Woon Cho, Chang-Koo Kim, Jin-Kwan Lee, Sang Heup Moon, and Heeyeop Chae, ¡°Angular dependences of SiO2 etch rates in C4F6/O2/Ar and C4F6/CH2F2/O2/Ar plasmas¡±, Journal of Vacuum Science and Technology A, 30 (5), pp.051301-1 - 051301-6 (2012, July 3).

48. S. G. Kandalkar, Hae-Min Lee, Seung Hye Seo, Kangtaek Lee, and Chang-Koo Kim, ¡°Cobalt-nickel composite films synthesized by chemical bath deposition method as an electrode material for supercapacitors¡±, Journal of Materials Science, 46 (9), pp.2977-2981 (2011, May 1).

49. S. G. Kandalkar, Hae-Min Lee, Heeyeop Chae, and Chang-Koo Kim, ¡°Structural, morphological, and electrical characteristics of the electrodeposited cobalt oxide electrode for supercapacitor applications¡±, Materials Research Bulletin, 46 (1), pp.48-51 (2011, Jan. 1).

50. S. G. Kandalkar, D. S. Dhawale, Chang-Koo Kim, and C. D. Lokhande, ¡°Chemical synthesis of cobalt oxide thin film electrode for supercapacitor application¡±, Synthetic Metals, 160 (11-12), pp.1299-1302 (2010, June 1). 2.109

51. Minho Noh, Taehoon Kim, Hosub Lee, Chang-Koo Kim, Sang-Woo Joo, and Kangtaek Lee, ¡°Fluorescence Quenching Caused by Aggregation of Water-Soluble CdSe Quantum Dots¡±, Colloids and Surfaces A: Physicochemical and Engineering Aspects, 359 (1-3), pp.39-44 (2010, Apr. 20).

52. Jin-Kwan Lee, Il-Yong Jang, Seung-Haeng Lee, Chang-Koo Kim, and Sang Heup Moon, ¡°Mechanism of sidewall necking and bowing in the plasma etching of high aspect-ratio contact holes¡±, Journal of the Electrochemical Society, 157 (3), pp.D142-D146 (2010, Jan. 12). 2.588

53. Jin-Kwan Lee, Il-Yong Jang, Seung-Haeng Lee, Chang-Koo Kim, and Sang Heup Moon, ¡°Cyclic deposition/etching process to etch a bowing-free SiO2 contact hole¡±, Journal of the Electrochemical Society, 156 (8), pp.D269-D274 (2009, Aug. 1). 2.588

54. Jin-Kwan Lee, Seung-Haeng Lee, Jae-Ho Min, Il-Yong Jang, Chang-Koo Kim, and Sang Heup Moon, ¡°Oblique-directional plasma etching of Si using a Faraday cage¡±, Journal of the Electrochemical Society, 156 (7), pp.D222-D225 (2009, Jul. 1). 2.588

55. Hae-Min Lee, Santosh K. Mahapatra, John Kiran Anthony, Fabian Rotermund, and Chang-Koo Kim, ¡°Effect of titanium ion concentration on electrodeposition of nanostructured TiNi films¡±, Journal of Materials Science, 44 (14), pp.3731-3735 (2009, Jul. 15).

56. S. M. S. I. Dulal, Hyeong Jin Yun, Chee Burm Shin, and Chang-Koo Kim, ¡°Electrodeposition of CoWP film V. Structural and morphological characterisations¡±, Applied Surface Science, 255 (11), pp.5795-5801 (2009, Mar. 15). 2.112

57. Hyongmoo Rhee, Hae Min Lee, Yun Mi Namkoung, Chang-Koo Kim, Heeyeop Chae, and Yil Wook Kim, ¡°Dependence of etch rates of silicon substrates on the use of C4F8 and C4F6 plasmas in the deposition step of the Bosch process¡±, Journal of Vacuum Science and Technology B, 27 (1), pp.33-40 (2009, Jan. 12).

58. S. M. S. I. Dulal, Tae Ho Kim, Hyongmoo Rhee, Joon Yong Sung, and Chang-Koo Kim, ¡°Development of an alkali-metal-free bath for electroless deposition of Co-W-P capping layers for copper interconnections¡±, Journal of Alloys and Compounds, 467 (1-2), pp.370-375 (2009, Jan. 7).

59. Hyeong Jin Yun, S. M. S. I. Dulal, Chee Burm Shin, and Chang-Koo Kim, ¡°Characterisation of electrodeposited Co-W-P amorphous coatings on carbon steel¡±, Electrochimica Acta, 54 (2), pp.370-375 (2008, Dec. 30). 3.777

60. S. M. S. I. Dulal, Tae Ho Kim, Chee Burm Shin, and Chang-Koo Kim, ¡°Electrodeposition of CoWP film IV. Effect of applied potential and current density¡±, Journal of Alloys and Compounds, 461 (1-2), pp.382-388 (2008, Aug. 11). 2.390

61. John Kiran Anthony, Hee Cheoul Kim, Hwang Woon Lee, S. Kumar Mahapatra, Hae Min Lee, Chang-Koo Kim, Kihong Kim, Hanjo Lim, and Fabian Roterrmund, ¡°Particle size-dependent giant nonlinear absorption in nanostructured Ni-Ti alloys¡±, Optics Express, 16 (15), pp.11193-11202 (2008, Jul. 10). 3.546

62. Tae Ho Kim, S. M. S. I. Dulal, Chang Han Park, Heeyeop Chae, and Chang-Koo Kim, ¡°Optimisation of process parameters for electroless plating of Co–W–P capping layers from an alkali-metal-free bath¡±, Surface & Coatings Technology, 202 (19), pp.4861-4867 (2008, Jun. 25). 1.941

63. Hyongmoo Rhee, Hyeokkyu Kwon, Chang-Koo Kim, HyunJung Kim, Jaisuk Yoo, and Yil Wook Kim, ¡°Comparison of deep silicon etching using SF6/C4F8 and SF6/C4F6 plasmas in the Bosch process¡±, Journal of Vacuum Science and Technology B, 26 (2), pp.576-581 (2008, Mar. 28). 1.267

64. S. M. S. I. Dulal, Chee Burm Shin, Joon Yong Sung, and Chang-Koo Kim, ¡°Electrodeposition of CoWP film II. Effect of electrolyte concentration¡±, Journal of Applied Electrochemistry, 38 (1), pp.83-91 (2008, Jan. 1). 1.836

65. S. M. S. I. Dulal, Hyeong Jin Yun, Chee Burm Shin, and Chang-Koo Kim, ¡°Electrodeposition of CoWP film III. Effect of pH and temperature¡±, Electrochimica Acta, 53 (2), pp.934-943 (2007, Dec. 1). 3.777

66. S. M. S. I. Dulal, Hyeong Jin Yun, Chee Burm Shin, and Chang-Koo Kim, ¡°Electrodeposition of CoWP Film I. Electrochemical and Compositional Analyses¡±, Journal of Electrochemical Society, 154 (10), pp.D494-D501 (2007, Oct. 1). 2.588

67. Hyun-Kyu Ryu, Yil-Wook Kim, Kangtaek Lee, Chee Burm Shin, and Chang-Koo Kim, ¡°A Comparative Study on a High Aspect Ratio Contact Hole Etching in UFC-containing and PFC-containing Plasmas¡±, Microelectronics Journal, 38 (1), pp.125-129 (2007, Jan. 1).

68. Jae-Ho Min, Jin-kwan Lee, Sang Heup Moon, and Chang-Koo Kim, ¡°Interactive Relationships between Sidewall and Bottom Etch Rates, As-affected by Sidewall angle, during SiO2 Etching in a CHF3 Plasma¡±, Journal of Vacuum Science and Technology B, 24 (4), pp.1746-1754 (2006, Jul. 1).

69. Hyun-Kyu Ryu, Yil-Wook Kim, Chee Burm Shin, and Chang-Koo Kim, ¡°Effect of Wafer Cleaning on the Interconnect Structure and Its Electrical Properties during the Al Dual Damascene Process for the Fabrication of Sub-100 nm Memory Devices¡±, Journal of Chemical Engineering of Japan, 38 (11), pp.922-928 (2005).

70. Jae-Ho Min, Jin-kwan Lee, Sang Heup Moon, and Chang-Koo Kim, ¡°Deep Etching of Silicon with Smooth Sidewalls by an Improved Gas-Chopping Process Using a Faraday Cage and a High Bias Voltage¡±, J. Vac. Sci. Tech. B, 23 (4), pp.1405-1411 (2005).

71. Jae-Ho Min, Gyeo-Re Lee, Jin-kwan Lee, Sang Heup Moon, and Chang-Koo Kim, ¡°Effect of Sidewall Properties on the Bottom Microtrench during SiO2 Etching in a CF4 Plasma¡±, J. Vac. Sci. Tech. B, 23 (2), pp.425-432 (2005).

72. Chang-Koo Kim and Chee Burm Shin, ¡°Plasma Molding over Surface Topography: Measurement of Energy and Angular Distributions of Ions Extracted through a Large Hole¡±, Thin Solid Films, 475 (1-2), pp.24-31 (2005). 1.604

73. Jae-Ho Min, Gyeo-Re Lee, Jin-kwan Lee, Chang-Koo Kim, and  Sang Heup Moon ¡°Improvement of SiO2 Pattern Profiles Etched in CF4 and SF6 Plasmas by Using a Faraday Cage and Neutral Beams¡±, Surface and Coatings Technology, 193 (1-3), pp.75-80 (2005).

74. Zhijian Wu, Hyeonwoo Joo, Ik-Sung Ahn, Jung-Hyun Kim, Chang-Koo Kim, and Kangtaek Lee, ¡°Design of Doped Hybrid Xerogels for a Controlled Release of Brillant Blue FCF¡±, Journal of Non-Crystalline Solids, 342, pp.46-53 (2004). 1.597

75. Jae-Ho Min, Gyeo-Re Lee, Jin-kwan Lee, Sang Heup Moon, and Chang-Koo Kim, ¡°Angular Dependence of Etch Rates in the Etching of Poly-Si and Fluorocarbon Polymer Using SF6, C4F8, and O2 Plasmas¡±, J. Vac. Sci. Tech. A, 22 (3), pp.661-669 (2004).

76. Jae-Ho Min, Gyeo-Re Lee, Jin-kwan Lee, Sang Heup Moon, and Chang-Koo Kim, ¡°Dependences of Bottom and Sidewall Etch Rates on Bias Voltage and Source Power during the Etching of Poly-Si and Fluorocarbon Polymer Using SF6, C4F8, and O2 Plasmas¡±, J. Vac. Sci. Tech. B, 22 (3), pp.893-901 (2004).

77. Hyun-Kyu Ryu, Byung-Seok Lee, Sung-Ki Park, Il-Wook Kim, and Chang-Koo Kim, ¡°Effect of CH2F2 Addition on a High Aspect Ratio Contact Hole Etching in a C4F6/O2/Ar Plasma¡±, Electrochemical and Solid-State Letters, 6 (9), pp.C126-C129 (2003). 2.010

78. Chang-Koo Kim and Demetre J. Economou, ¡°Plasma Molding over Surface Topography: Energy and Angular Distribution of Ions Extracted out of Large Holes¡±, J. Appl. Phys., 91 (5), pp.2594-2603 (2002). 2.210

79. Chang-Koo Kim, A. Kubota and Demetre J. Economou, ¡°Molecular Dynamics Simulation of Silicon Surface Smoothing by Low-Energy Argon Cluster Impact¡±, J. Appl. Phys. 86 (12), pp.6758-6762 (1999).

80. Chang-Koo Kim, Chang-Hwa Chung, and Sang Heup Moon, ¡°Suppression of Oxide Growth on Porous Silicon by treatment with HF Vapor¡±, J. Appl. Phys. 78 (12), pp.7392-7394 (1995).
 

 

Domestic Journal (SCI)

  1. Jun-Hyun Kim, Jin-Su Park, Yong-Seon Shin, and Chang-Koo Kim, ""Atmospheric-pressure floating electrode-dielectric barrier discharge with flexible electrodes: Effect of conductor shapes", Korean Journal of Chemical Engineering, 36, pp.1371-1376 (2019, July 31).

2. Jun-Hyun Kim, Hae-Min Lee, Doo Won Kang, Kyung Mi Lee, and Chang-Koo Kim, ¡°Effect of oxygen flow rate on the electrical and optical characteristics of dopantless tin oxide films fabricated by LPCVD¡±, Korean Journal of Chemical Engineering, 33 (9), pp.2711-2715 (2016, Sep. 1).

3. S. Rajagopal, Hae-Min Lee, Kangtaek Lee, and Chang-Koo Kim, ¡°Hydrothermal synthesis of one-dimensional tungsten oxide nanostructures using cobalt ammonium sulfate as a structure-directing agent¡±, Korean Journal of Chemical Engineering, 30 (10), pp.1833-1835 (2013, Oct. 1).

4. Hae-Min Lee, Heeyeop Chae, and Chang-Koo Kim, ¡°Electroless deposition of NiMoP films using alkali-free chemicals for capping layers of copper interconnections¡± Korean Journal of Chemical Engineering, 29 (9), pp.1259-1265 (2012, Sep. 1).

5. Sunil G. Kandalkar, Hae-Min Lee, Seung Hye Seo, Kangtaek Lee, and Chang-Koo Kim, ¡°Preparation and characterization of the electrodeposited Ni-Co oxide thin films for electrochemical capacitors¡±, Korean Journal of Chemical Engineering, 28 (6), pp.1464-1467 (2011, Jun. 1).

6. Yun Mi Namkoung, Hae-Min Lee, Young-Seon Son, Kangtaek Lee, and Chang-Koo Kim, ¡°Characteristics of electrodeposited CoWP capping layers using alkali-metal-free precursors¡±, Korean Journal of Chemical Engineering, 27 (5), pp.1596-1600 (2010, Sep. 1).

7. Kitae Lee, Deokkyu Lee, Hosub Lee, Chang-Koo Kim, Zhijian Wu, and Kangtaek Lee, ¡°Comparison of amine-functionalized mesoporous silica particles for ibuprofen delivery¡±, Korean Journal of Chemical Engineering, 27 (4), pp.1333-1337 (2010, Jul. 1).

8. Sang Ho Woo, Yil Wook Kim, Pyung Yong Um, Hae-Min Lee, and Chang-Koo Kim, ¡°Film Properties of Nitrogen-Doped Polycrystalline Silicon for Advanced Gate Material¡±, Korean Journal of Chemical Engineering, 26 (3), pp.824-827 (2009, May 1).

9. Chijung Kim, Donghun Jeong, Jinha Hwang, Heeyeop Chae, and Chang-Koo Kim, ¡°Argon and nitrogen plasma surface treatments of polyimide films for electroless copper plating¡±, Journal of the Korean Physical Society, 54 (2), pp.621-627 (2009, Feb. 2).

10. Sungi Jang, Heeyeop Chae, Donggeun Jung, Hyoungsub Kim, and Chang-Koo Kim, ¡°Simultaneous Oxygen Plasma and Thermal Treatments of an ITO Surface to Improve the Electrical Characteristics of Organic Light-Emitting Diodes¡±, Journal of the Korean Physical Society, 51 (3), pp.956-962 (2007, Sep. 9).

11. Hyeong Jin Yun, Tae Ho Kim, Chee Burm Shin, Chang-Koo Kim, Jae-Ho Min, and Sang-Heup Moon, ¡°Comparison of atomic scale etching of poly-Si in inductively coupled Ar and He plasmas¡±, Korean Journal of Chemical Engineering, 24 (4), pp.670-673 (2007, Jul. 1).

12. Chang-Koo Kim, ¡°Ion Dynamics in Plasma Processing for the Fabrication of Ultrafine Structures¡±, Korean J. Chem. Eng., 22 (5), pp.762-769 (2005).

13. Chang-Koo Kim, ¡°Analysis of Langmuir Probe Data in High Density Plasmas¡±, Korean J. Chem. Eng., 21 (3), pp.746-751 (2004).

14. Jung-Hyun Ryu, Byeong-Ok Cho, Sung-Wook Hwang, Sang Heup Moon, and Chang-Koo Kim, ¡°Trajectories of Ions inside Faraday Cage Located in a High Density Plasma Etcher¡±, Korean J. Chem. Eng., 20 (2), pp.407-413 (2003).

15. Chang-Koo Kim, Chan-Hwa Chung, and Sang Heup Moon, ¡°Removal of Organic Impurities from the Silicon Surface by Oxygen and UV Cleaning¡±, Korean J. Chem. Eng.,13 (3), pp.328-330 (1996).

 

Domestic Journal (non-SCI)

 

1. Hyeok-Kyu Kwon, Sanghyun You, Jun-Hyun Kim, and Chang-Koo Kim, ¡°Optical and Electrical Characteristics of Fluorocarbon Films Deposited in aa High-Density C4F8 Plasma¡±, Korean Chemical Engineering Research, 59, pp.254-259 (2021, February 6).

2. Jun-Hyun Kim, Chang Jin Park, and Chang-Koo Kim, ¡°Atmospheric floating electrode-dielectric barrier discharges (FE-DBDs) having flexible electrodes¡±, Korean Chemical Engineering Research, 57, pp.432-437 (2019, March 23).

3. Hae-Min Lee, Sung-Woon Cho, Jun-Hyun Kim, and Chang-Koo Kim, ¡°Electrochemical analysis of the electrodeposition of platinum nanoparticles¡±, Korean Chemical Engineering Research, 53 (5), pp.540-544 (2015).

4. Jung Min Ji, Sung-Woon Cho, and Chang-Koo Kim, ¡°Effects of Ar addition on the etch rates and etch profiles of Si substrates during the Bosch process¡±, Korean Chemical Engineering Research, 51 (6), pp.755-759 (2013).

5. Tae Ho Kim, Hyeong Jin Yun, and Chang-Koo Kim, ¡°Electroless Plating of Co-Alloy Thin Films using Alkali-Free Chemicals¡±, Korean Chemical Engineering Research, 45 (6), pp.633-637 (2007).

6. Chang-Koo Kim, ¡° A Study on the Energy and Angular Distribution of Ions Effusing from a Hole in Contact with a High Density Plasma¡±, Transport Phenomena, 17 (1), pp.23-28 (2003).

7. Chang-Koo Kim, ¡°Introduction to Atomic Layer Etching¡±, Materials, 13 (2), pp.2-7 (2002).

 

Proceeding Volume

 

1. Yil Wook Kim, Sang Ho Woo, Hai Won Kim, Pyung Yong Um, Jung-Min Ji, and Chang-Koo Kim, ¡°Formation and characterization of thin silicon dioxide films obtained by inductively-coupled high-density plasmas using a dual rotated spiral antenna system¡±, ECS Transactions, 25 (6), pp.173-178 (2009).

2. Sang Ho Woo, Yil Wook Kim, Pyung Yong Um, Hai Won Kim, Sung Kil Cho, Hyung Su Choe, Dong Keu Lee, and Chang-Koo Kim, ¡°Structural And Morphological Properties of Nitrogen-Doped Polysilicon for Advanced Gate Material¡±, ECS Transactions, 11 (4), pp.601-606 (2007).

3. Chang-Koo Kim and Demetre J. Economou, ¡°Energy and Angular Distribution of Ions Extracted from a Large Hole in contact with a High Density Plasma¡±, in Fundamental Gas-Phase and Surface Chemistry of Vapor-Phase Deposition ¥±, Electrochem. Soc. Symp. Proc. PV2001-13, edited by M. T. Swilhart, M. D. Allendorf, and M. Meyyappan, pp.405-414 (2001).

4. Chan-Hwa Chung, Chang-Koo Kim, and Sang Heup Moon, ¡°Monitoring of the Surface Species on Silicon After Chemical Cleaning Cy FTIR Spectroscopy¡±, in Ultraclean Semiconductor Processing Technology and Surface Chemical Cleaning and Passivation, Mat. Res. Soc. Symp. Proc. Vol. 386, edited by Michael Liehr, Marc Heyns, Masataka Hirose, and Harold Parks, pp.291-296 (1995).

 

 

 

°³ÀÎÁ¤º¸ 󸮹æÄ§                 Home : Top

 
 

°æ±âµµ ¼ö¿ø½Ã ¿µÅ뱸 ¿ùµåÄÅ·Î 206 ¾ÆÁÖ´ëÇб³ È­°ø½ÇÇ赿 205-1È£
Copyright (c) 2019 Surface Processing Laboratory. All right reserved.

TEL:+82-31-219-2948